ELASTIC MODULUS DETERMINATION OF NANOLAYERS BY THE ATOMIC-FORCE MICROSCOPY METHOD

Pogotskaya I.V., Engineer of the Institute of Heat and Mass Transfer n.a. A.V. Lykov of the NAS of Belarus, Minsk, Republic of Belarus, This email address is being protected from spambots. You need JavaScript enabled to view it.

Kuznetsova T.A., Senior Researcher of the Institute of Heat and Mass Transfer n.a. A.V. Lykov of the NAS of Belarus, Minsk, Republic of Belarus

Chizhik S.A., Corresponding member of the NAS of Belarus, Doctor of Technical Sciences, Professor, Chief Scientific Secretary of the NAS of Belarus, Minsk, Republic of Belarus

We defined the local elastic modulus of single layer, polyvinylpyridine (PVP), and twolayer, polymethylmethacrylate coated with a polyvinylpyridine (PMMA+PVP). Polymer films with nanometer thickness (10-13 nm) formed on the silicon surface using the LangmuirBlodgett method. The experiment was conducted using the static force spectroscopy mode of atomic force microscopy method provides data about the bending of the console of the probe during its contact with the surface of the sample. Estimates were based on a mathematical model of contact deformation of layered systems, taking into account the thickness of the coating and the effect of the substrate. Based on the data of the elastic properties of thin coatings has been suggested the influence of the hyperfine polymer layer of PMMA to the properties of twolayer coating as a result of its force fields of silicon screening, which have a structuring effect on the inflicted layer.

atomic force microscopy, Langmuir-Blodgett films, elastic modulus

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