THE METHOD OF CORRECTION HYSTERESIS PIEZOSCANNER ATOMIC FORCE MICROSCOPE

Mohammed Salem A.A. Postgraduate Student, This email address is being protected from spambots. You need JavaScript enabled to view it., Belarusian National Technical University, Minsk, Republic of Belarus

Melnikova Galina D. Research Associate

Makhaniok Aleksandr A., Cand. Phys.-Math. Sc. Senior Researcher, This email address is being protected from spambots. You need JavaScript enabled to view it.

Chizhik Sergey A., Academician, Dr. Techn. Sc., Professor First Deputy Chairman of the Presidium of the NAS of Belarus, Presidium of the Nftional Academy of Sciences of Belarus, Minsk, Republic of Belarus

Kyzhel Natalya S. Junior Researcher, A.V. Luikov Heat and Mass Transfer Institute of the National Academy of Sciences of Belarus, Minsk, Republic of Belarus

The method of correcting software hysteresis piezoscanner atomic force microscope was proposed. The algorithm for correction was used for the samples of silicon, mica, polysulfone, and human erythrocytes, and platelets. It is shown that the proposed method can effectively eliminate the difference between the curves of supply and discharge of the working area due to piezo hysteresis and is valid for different delay times between measurements at neighboring points of these curves.

piezo hysteresis, static force spectroscopy, the point of contact

• Andreeva N.V., Gabdullin P.G. Fizika i diagnostika biomolekuljarnyh sistem. Issledovanie metodami zondovoj mikroskokopii [Physics and diagnostics of biomolecular systems. Investigation probe microscopy methods]. Saint-Petersburg, Publ. Politeh. Univer., 2012.
• Ricci D., Braga P.C. Recognizing and avoiding artifacts in AFM imaging In. Methods in Molecular Biology. Atomic Force Microscopy: Biomedical Methods and Applications. Humana Press Inc., New-York, 2004, vol. 242, pp. 25-37.
• Timoshenko S.P. Teorija uprugosti [Theory of elasticity]. L., 1937.
• Johnson K.L., Kendall K., Roberts A.D. Surface energy and the contact of elastic solids. Proc. R. Soc. Lond., 1971, vol. 324, pp. 301-313.
• Derjaguin B.V., Muller V.M., Toporov Yu.P. Effect of contact deformations on the adhesion of particles. J. Colloid interface Sci., 1975, vol. 53, pp. 314-326.
• Maugis D. Adhesion of spheres: the JKR%DMT transition using a Dugdale model. J. Colloid interface Sci., 1992, vol. 150, pp. 243-269.
• Garishin O.K. Modelirovanie vzaimodejstvija zonda atomno-silovogo mikroskopa s polimernoj poverhnost’ju s uchetom sil Van-der-Vaal’sa i poverhnostnogo natjazhenija [Modelling theinteraction of the probe of an atomic force microscope with a polymer surface, taking into account of van der Waals forces and surface tension]. Nanosistemy: Fizika, Himija, Matematika [Nanosystems: Physics, Chemistry, Mathematics], 2012, vol. 3, pp. 47-54.
• Garishin O.K. Modelirovanie kontaktnogo rezhima raboty atomno%silovogo mikroskopa s uchetom nemehanicheskih sil vzaimodejstvija s poverhnost’ju obrazca [Simulation of the contact mode AFM based on non-mechanical strength of interaction with the sample surface]. Vychislitel’naja mehanika sploshnyh sred [Computational Continuum Mechanics], 2012, vol. 5, no. 1, pp. 61-69.
• Mohammed Salem A.A., Mel’nikova G.B., Mahanjok A.A., Chizhik S.A. Metodicheskie aspekty opredelenija modulja uprugosti vysokojelastichnyh materialov i biologicheskih kletok metodom silovoj spektroskopii [Methodological aspects of the modulus of elastomeric materials and biological cells by force spectroscopy measurement]. Mehanika mashin, mehanizmov I materialov [Mechanics of machines, mechanisms and materials], 2015, no. 2, pp .80-84.